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Chemical stability and surface stoichiometry of vanadium oxide phases studied by reactive molecular dynamics simulationsGo to Link

Jeon, B (Jeon, Byoungseon), Ko, C (Ko, Changhyun), van Duin, ACT (van Duin, Adri, Ramanathan, S (Ramanathan, Shr

ArticleIssue Date2012CitationSURFACE SCIENCE, v.606, no.3-4, pp.516 - 522PublisherELSEVIER SCIENCE BV
Dielectric and carrier transport properties of vanadium dioxide thin films across the phase transition utilizing gated capacitor devicesGo to Link

Yang, Z (Yang, Zheng), Ko, CH (Ko, Changhyun), Balakrishnan, V (Balakrishnan,, Gopalakrishnan, G (Gopalakrish, Ramanathan, S (Ramanathan, Shr

ArticleIssue Date2010CitationPHYSICAL REVIEW B, v.82, no.20PublisherAMER PHYSICAL SOC
Dispersive capacitance and conductance across the phase transition boundary in metal-vanadium oxide-silicon devices

Ko, CH (Ko, Changhyun), Ramanathan, S (Ramanathan, Shr

ArticleIssue Date2009CitationJOURNAL OF APPLIED PHYSICS, v.106, no.3, pp.1 - 6PublisherAMER INST PHYSICS
Effect of ultraviolet irradiation on electrical resistance and phase transition characteristics of thin film vanadium oxide

Ko, C (Ko, Changhyun), Ramanathan, S (Ramanathan, Shr

ArticleIssue Date2008CitationJOURNAL OF APPLIED PHYSICS, v.103, no.10, pp.1 - 4PublisherAMER INST PHYSICS
High temperature electrical conduction in nanoscale hafnia films under varying oxygen partial pressureGo to Link

Ko, C (Ko, Changhyun), Shandalov, M (Shandalov, Micha, McIntyre, PC (McIntyre, Paul C, Ramanathan, S (Ramanathan, Shr

ArticleIssue Date2010CitationAPPLIED PHYSICS LETTERS, v.97, no.8PublisherAMER INST PHYSICS
In situ studies on twinning and cracking proximal to insulator-metal transition in self-supported VO2/Si3N4 membranesGo to Link

Balakrishnan, V (Balakrishnan,, Ko, C (Ko, Changhyun), Ramanathan, S (Ramanathan, Shr

ArticleIssue Date2012CitationJOURNAL OF MATERIALS RESEARCH, v.27, no.11, pp.1476 - 1481PublisherCAMBRIDGE UNIV PRESS
Nanoscale imaging and control of resistance switching in VO2 at room temperatureGo to Link

Kim, J (Kim, Jeehoon), Ko, C (Ko, Changhyun), Frenzel, A (Frenzel, Alex), Ramanathan, S (Ramanathan, Shr, Hoffman, JE (Hoffman, Jennifer

ArticleIssue Date2010CitationAPPLIED PHYSICS LETTERS, v.96, no.21PublisherAMER INST PHYSICS
Observation of electric field-assisted phase transition in thin film vanadium oxide in a metal-oxide-semiconductor device geometry

Ko, C (Ko, Changhyun), Ramanathan, S (Ramanathan, Shr

ArticleIssue Date2008CitationAPPLIED PHYSICS LETTERS, v.93, no.25, pp.1 - 4PublisherAMER INST PHYSICS
Operational characteristics of thin film solid oxide fuel cells with ruthenium anode in natural gasGo to Link

Takagi, Y (Takagi, Yuto), Kerman, K (Kerman, Kian), Ko, C (Ko, Changhyun), Ramanathan, S (Ramanathan, Shr

ArticleIssue Date2013CitationJOURNAL OF POWER SOURCES, v.243, pp.1 - 9PublisherELSEVIER SCIENCE BV
Orientation dependent oxygen exchange kinetics on single crystal SrTiO3 surfacesGo to Link

Kerman, K (Kerman, Kian), Ko, CH (Ko, Changhyun), Ramanathan, S (Ramanathan, Shr

ArticleIssue Date2012CitationPHYSICAL CHEMISTRY CHEMICAL PHYSICS, v.14, no.34, pp.11953 - 11960PublisherROYAL SOC CHEMISTRY
Oxide Electronics Utilizing Ultrafast Metal-Insulator TransitionsGo to Link

Yang, Z (Yang, Zheng), Ko, Chang Hyun, Ramanathan, S (Ramanathan, Shr

ArticleIssue Date2011CitationANNUAL REVIEW OF MATERIALS RESEARCH, VOL 41, v.41, pp.337 - 367PublisherANNUAL REVIEWS
Probing compositional disorder in vanadium oxide thin films grown on atomic layer deposited hafnia on silicon by capacitance spectroscopyGo to Link

Ko, C (Ko, Changhyun), Zhou, Y (Zhou, You), Ramanathan, S (Ramanathan, Shr

ArticleIssue Date2012CitationJOURNAL OF VACUUM SCIENCE TECHNOLOGY A, v.30, no.1PublisherA V S AMER INST PHYSICS
Size effects on stress relaxation across the metal-insulator transition in VO2 thin filmsGo to Link

Balakrishnan, V (Balakrishnan,, Ko, C (Ko, Changhyun), Ramanathan, S (Ramanathan, Shr

ArticleIssue Date2011CitationJOURNAL OF MATERIALS RESEARCH, v.26, no.11, pp.1384 - 1387PublisherCAMBRIDGE UNIV PRESS
Stability of electrical switching properties in vanadium dioxide thin films under multiple thermal cycles across the phase transition boundary

Ko, C (Ko, Changhyun), Ramanathan, S (Ramanathan, Shr

ArticleIssue Date2008CitationJOURNAL OF APPLIED PHYSICS, v.104, no.8, pp.1 - 4PublisherAMER INST PHYSICS
Studies on electric triggering of the metal-insulator transition in VO2 thin films between 77 K and 300 KGo to Link

Yang, Z (Yang, Zheng), Hart, S (Hart, Sean), Ko, C (Ko, Changhyun), Yacoby, A (Yacoby, Amir), Ramanathan, S (Ramanathan, Shr

ArticleIssue Date2011CitationJOURNAL OF APPLIED PHYSICS, v.110, no.3PublisherAMER INST PHYSICS
Studies on oxygen chemical surface exchange and electrical conduction in thin film nanostructured titania at high temperatures and varying oxygen pressureGo to Link

Ko, CH (Ko, Changhyun), Karthikeyan, A (Karthikeyan, A, Ramanathan, S (Ramanathan, Shr

ArticleIssue Date2011CitationJOURNAL OF CHEMICAL PHYSICS, v.134, no.1PublisherAMER INST PHYSICS
Terahertz spectroscopy studies on epitaxial vanadium dioxide thin films across the metal-insulator transitionGo to Link

Mandal, P (Mandal, Pankaj), Speck, A (Speck, Andrew), Ko, C (Ko, Changhyun), Ramanathan, S (Ramanathan, Shr

ArticleIssue Date2011CitationOPTICS LETTERS, v.36, no.10, pp.1927 - 1929PublisherOPTICAL SOC AMER
Thermal conductivity and dynamic heat capacity across the metal-insulator transition in thin film VO2Go to Link

Oh, DW (Oh, Dong-Wook), Ko, C (Ko, Changhyun), Ramanathan, S (Ramanathan, Shr, Cahill, DG (Cahill, David G.)

ArticleIssue Date2010CitationAPPLIED PHYSICS LETTERS, v.96, no.15PublisherAMER INST PHYSICS
Thermoelastic switching with controlled actuation in VO2 thin filmsGo to Link

Viswanath, B (Viswanath, B.), Ko, CH (Ko, Changhyun), Ramanathan, S (Ramanathan, Shr

ArticleIssue Date2011CitationSCRIPTA MATERIALIA, v.64, no.6, pp.490 - 493PublisherPERGAMON-ELSEVIER SCIENCE LTD
Thickness-dependent orientation evolution in nickel thin films grown on yttria-stabilized zirconia single crystalsGo to Link

Viswanath, B (Viswanath, B.), Ko, C (Ko, Changhyun), Ramanathan, S (Ramanathan, Shr

ArticleIssue Date2011CitationPHILOSOPHICAL MAGAZINE, v.91, no.34, pp.4311 - 4323PublisherTAYLOR FRANCIS LTD
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