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Kinetic Stabilization and Magnetism of Fe Films on NiO(001)

Authors
Yang, SeolunPark, H. -K.Kim, J. -S.
Issue Date
Nov-2011
Publisher
KOREAN PHYSICAL SOC
Keywords
NiO; Ag; Ultrathin film
Citation
JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.59, no.5, pp 3141 - 3145
Pages
5
Journal Title
JOURNAL OF THE KOREAN PHYSICAL SOCIETY
Volume
59
Number
5
Start Page
3141
End Page
3145
URI
https://scholarworks.sookmyung.ac.kr/handle/2020.sw.sookmyung/12462
DOI
10.3938/jkps.59.3141
ISSN
0374-4884
1976-8524
Abstract
Kinetic stabilization of the interface between Fe and NiO films is achieved by growing Fe films on NiO films at low temperature (<= 90 K) as revealed by X-ray photoelectron spectroscopy. This allows us to examine the effects of the interface coupling on the exchange bias of the Fe film due to the NiO film. No definite exchange bias of Fe film is, however, observed for (<= 3 ML) ultrathin NiO films in an X-ray magnetic circular dichroism study. This tells us that exchange bias between Fe and NiO does not originate solely from the coupling between Fe and NiO at the interface.
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첨단소재·전자융합공학부 (신소재물리전공)
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