Directionality of o-Phthalaldehyde adsorbed onto H-passiyated Si(100) Surface Characterized by NEXAFS and HRPES
- Authors
- Kim, Ki-jeong; Yang, Sena; Kang, Tai-Hee; Kim, Bongsoo; Lee, Hangil
- Issue Date
- Jul-2010
- Publisher
- WILEY-V C H VERLAG GMBH
- Keywords
- o-Phthalaldehyde; H-Si(100); HRPES; NEXAFS; 1-D Organic molecular line
- Citation
- BULLETIN OF THE KOREAN CHEMICAL SOCIETY, v.31, no.7, pp 1973 - 1975
- Pages
- 3
- Journal Title
- BULLETIN OF THE KOREAN CHEMICAL SOCIETY
- Volume
- 31
- Number
- 7
- Start Page
- 1973
- End Page
- 1975
- URI
- https://scholarworks.sookmyung.ac.kr/handle/2020.sw.sookmyung/13167
- DOI
- 10.5012/bkcs.2010.31.7.1973
- ISSN
- 0253-2964
1229-5949
- Abstract
- The electronic and adsorption structure of o-phthalaldehyde (OPA) on the H-Si(100) surface was investigated by using Near Edge X-ray Fine Structure (NEXAFS) and high resolution photoemission spectroscopy (HRPES). We confirmed that the OPA grown on the H-Si(100) surface showed good dependency with about 60 degree tilting angle using NEXAFS and a single O 1s peak by using HRPES. Hydrogen atom passivated on the Si(100) surface was found to be a seed for making one dimensional organic line that uses a chain reaction as the H-Si(100) surface was compared with the hydrogen free Si(100) surface.
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