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A dual analyzer for real-time impedance and noise spectroscopy of nanoscale devices

Authors
Joo, MKKang, PKim, YKim, GTKim, S
Issue Date
Mar-2011
Publisher
AMER INST PHYSICS
Citation
REVIEW OF SCIENTIFIC INSTRUMENTS, v.82, no.3
Journal Title
REVIEW OF SCIENTIFIC INSTRUMENTS
Volume
82
Number
3
URI
https://scholarworks.sookmyung.ac.kr/handle/2020.sw.sookmyung/147785
DOI
10.1063/1.3553208
ISSN
0034-6748
1089-7623
Abstract
This paper introduces a simple portable dual analyzer which allows real-time ac-impedance measurements and noise spectroscopic analysis simultaneously, employing one or two data acquisition systems together with a low noise current-to-voltage preamplifier. The input signal composed of numerous selected frequencies of sinusoidal voltages with a dc bias was applied to a device under the test (DUT): single walled carbon nanotube field effect transistors (SWCNT-FETs). Each frequency component, ranging from 1 to 46.4 kHz, was successfully mapped to a Nyquist plot using the background of the electrical noise power spectrum. It is, thus, clearly demonstrated that this dual analyzer enables the real-time ac-impedance analysis and the frequency response of the carrier transport in the SWCNT-FETs as a DUT. (C) 2011 American Institute of Physics. [doi:10.1063/1.3553208]
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