Sub-cell characterization of two-terminal perovskite/silicon tandem solar cellsopen access
- Authors
- Park, Jae Hyun; Ji, Su Geun; Park, Ik Jae; Hwang, Sun Kyung; Lim, Hyun Woo; Kim, Jin Young
- Issue Date
- Oct-2022
- Publisher
- ELSEVIER
- Keywords
- charge-carrier dynamics; defect analysis; monolithic perovskite/silicon tandem solar cells; sub-cell characterization; sub-cell-selective light bias
- Citation
- CELL REPORTS PHYSICAL SCIENCE, v.3, no.10, pp 1 - 11
- Pages
- 11
- Journal Title
- CELL REPORTS PHYSICAL SCIENCE
- Volume
- 3
- Number
- 10
- Start Page
- 1
- End Page
- 11
- URI
- https://scholarworks.sookmyung.ac.kr/handle/2020.sw.sookmyung/152385
- DOI
- 10.1016/j.xcrp.2022.101076
- ISSN
- 2666-3864
2666-3864
- Abstract
- Although significant improvements in performance have been reported for monolithic perovskite/silicon tandem solar cells (PVSK/Si TSCs), the lack of simple electrical characterization methods impedes further development of monolithic TSCs. In this article, we report comprehensive electrical characterization methods that can accurately and easily analyze the sub-cells of two-terminal PVSK/Si TSCs. Using a highly efficient three-terminal PVSK/Si TSC conceived for the sub-cell analysis, fundamental electrical characterization methods, such as J-V characteristics, external quantum efficiency, impedance spectroscopy, and thermal admittance spectroscopy, are investigated to suggest a characterization platform for the sub-cell analysis of monolithic two-terminal PVSK/Si TSCs.
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