Junction area dependence of tunneling magnetoresistance
- Authors
- Lee, SS; Wang, SX; Park, CM; Rhee, JR; Yoon, CS; Chang, PJ; Kim, CK
- Issue Date
- Feb-2002
- Publisher
- ELSEVIER SCIENCE BV
- Keywords
- spin dependent tunneling; natural oxidation; tunneling magnetoresistance; resistance-area products (R x A)
- Citation
- JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, v.239, no.1-3, pp 129 - 131
- Pages
- 3
- Journal Title
- JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS
- Volume
- 239
- Number
- 1-3
- Start Page
- 129
- End Page
- 131
- URI
- https://scholarworks.sookmyung.ac.kr/handle/2020.sw.sookmyung/16439
- DOI
- 10.1016/S0304-8853(01)00590-X
- ISSN
- 0304-8853
1873-4766
- Abstract
- Spin dependent tunneling devices Ta/NiFe/Ta/NiFe/FeMn/NiFe/CoFe/Al2O3/CoFe/NiFe/Al with in-situ naturally oxidized Al2O3 barrier were fabricated using ion beam deposition and DC sputtering. The as-deposited and post-annealing junctions showed tunneling magneto resistance of 8-18% with resistance-area products (R x A) of 340-60 Omega mum(2), which were dependent on the junction area (81-4 mum(2)). (C) 2002 Elsevier Science B.V. All rights reserved.
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