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Junction area dependence of tunneling magnetoresistance

Authors
Lee, SSWang, SXPark, CMRhee, JRYoon, CSChang, PJKim, CK
Issue Date
Feb-2002
Publisher
ELSEVIER SCIENCE BV
Keywords
spin dependent tunneling; natural oxidation; tunneling magnetoresistance; resistance-area products (R x A)
Citation
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, v.239, no.1-3, pp 129 - 131
Pages
3
Journal Title
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS
Volume
239
Number
1-3
Start Page
129
End Page
131
URI
https://scholarworks.sookmyung.ac.kr/handle/2020.sw.sookmyung/16439
DOI
10.1016/S0304-8853(01)00590-X
ISSN
0304-8853
1873-4766
Abstract
Spin dependent tunneling devices Ta/NiFe/Ta/NiFe/FeMn/NiFe/CoFe/Al2O3/CoFe/NiFe/Al with in-situ naturally oxidized Al2O3 barrier were fabricated using ion beam deposition and DC sputtering. The as-deposited and post-annealing junctions showed tunneling magneto resistance of 8-18% with resistance-area products (R x A) of 340-60 Omega mum(2), which were dependent on the junction area (81-4 mum(2)). (C) 2002 Elsevier Science B.V. All rights reserved.
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