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Nanoscale probing of ferroelectric domain switching using piezoresponse force microscopyopen access
- Authors
- Yang, Sang Mo; Kim, Yunseok
- Issue Date
- Jul-2019
- Publisher
- Korean Ceramic Society
- Keywords
- Capacitor; Ferroelectric domain; Piezoresponse force microscopy; Switching behavior
- Citation
- Journal of the Korean Ceramic Society, v.56, no.4, pp 340 - 349
- Pages
- 10
- Journal Title
- Journal of the Korean Ceramic Society
- Volume
- 56
- Number
- 4
- Start Page
- 340
- End Page
- 349
- ISSN
- 1229-7801
2234-0491
- Abstract
- In ferroelectric materials, piezoresponse force microscopy (PFM) has been widely used to explore ferroelectric domain switching. In this article, we review the fundamentals of nanoscale probing of ferroelectric domain switching using PFM, including the basic principles of PFM and a variety of PFM studies on local domain switching. We also introduce advanced PFM techniques for exploring switching behavior. Finally, we discuss several issues and perspectives in nanoscale probing of ferroelectric domain switching using PFM. PFM has played an important role in exploring switching behavior in ferroelectric materials, and it could be further developed to probe more detailed switching information. © 2019 Korean Ceramic Society. All rights reserved.
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