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Effect of substrate orientation on ferroelectric behavior of monoclinic BiFeO3 thin film
- Authors
- Jeon, B. C.; Yang, S. M.; Chae, S. C.
- Issue Date
- May-2017
- Publisher
- ELSEVIER SCIENCE BV
- Keywords
- Ferroelectric; BiFeO3; Pulsed laser deposition
- Citation
- CURRENT APPLIED PHYSICS, v.17, no.5, pp 684 - 687
- Pages
- 4
- Journal Title
- CURRENT APPLIED PHYSICS
- Volume
- 17
- Number
- 5
- Start Page
- 684
- End Page
- 687
- ISSN
- 1567-1739
1878-1675
- Abstract
- We report on ferroelectric properties of the monoclinic BiFeO3 thin films grown on (001) and (110) SrTiO3 substrates. Structural analysis using X-ray diffractometer and the electrical characterization of ferroelectricity reveal that the elastic constraint induced by the crystallographic orientation affects the remnant polarization values and retention properties of BiFeO3. The in-depth analysis based on the Williamson-Hall plot and thermodynamic analysis manifests that inhomogeneous strain related to the strain relaxation in the film is responsible for the change of the out-of-plane polarization and retention property of BiFeO3 thin films depending on the substrate orientation. (C) 2016 Elsevier B.V. All rights reserved.
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