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Low resistivity of Pt silicide nanowires measured using double-scanning-probe tunneling microscopy
- Lim, Do Kyung;
- Kubo, Osamu;
- Shingaya, Yoshitaka;
- Nakayama, Tomonobu;
- Kim, Young Heon;
- ... Lee, Hangil;
- 외 4명
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- Low resistivity of Pt silicide nanowires measured using double-scanning-probe tunneling microscopy
- 저자
- Lim, Do Kyung; Kubo, Osamu; Shingaya, Yoshitaka; Nakayama, Tomonobu; Kim, Young Heon; Lee, Jeong Yong; Aono, Masakazu; Lee, Hangil; Lee, Dohyun; Kim, Sehun
- 발행일
- 2008-05
- 권
- 92
- 호
- 20
- 언어
- ENG
- 출판사
- AIP
- 발행국가
- 미국
- ISSN
- E 1077-3118
P 0003-6951