Nanoscale probing of ferroelectric domain switching using piezoresponse force microscopy
  • Yang, Sang Mo
  • Kim, Yunseok
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초록

In ferroelectric materials, piezoresponse force microscopy (PFM) has been widely used to explore ferroelectric domain switching. In this article, we review the fundamentals of nanoscale probing of ferroelectric domain switching using PFM, including the basic principles of PFM and a variety of PFM studies on local domain switching. We also introduce advanced PFM techniques for exploring switching behavior. Finally, we discuss several issues and perspectives in nanoscale probing of ferroelectric domain switching using PFM. PFM has played an important role in exploring switching behavior in ferroelectric materials, and it could be further developed to probe more detailed switching information. © 2019 Korean Ceramic Society. All rights reserved.

키워드

CapacitorFerroelectric domainPiezoresponse force microscopySwitching behaviorCapacitorsFerroelectricityNanotechnologyScanning probe microscopySwitchingBasic principlesDomain switchingsFerroelectric domain switchingFerroelectric domainsNano scalePiezoresponse force microscopySwitching behaviorsFerroelectric materials
제목
Nanoscale probing of ferroelectric domain switching using piezoresponse force microscopy
저자
Yang, Sang MoKim, Yunseok
DOI
10.4191/kcers.2019.56.4.05
발행일
2019-07
유형
Article
저널명
한국세라믹학회지
56
4
페이지
340 ~ 349