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초록
As the film becomes atomically thin, the on-site Coulomb interaction energy between two 3p holes of the NiO films on Ag(001) U (Ni 3p) significantly decreases as revealed by both X-ray photoelectron and Auger electron spectroscopies. The reduction of U (Ni 3p) for the ultrathin films is well accounted for by varied image potentials and polarization energies in the films from their bulk values. The present results confirm a previous model predicting the reduction of charge fluctuation energies in ultrathin oxide films on highly polarizable substrates due to the extra-atomic relaxations. (C) 2013 Elsevier B.V. All rights reserved.
키워드
Ultrathin NiO film; Ag; Coulomb correlation energy; Charge transfer energy; Image charge potential; Polarization energy; ION SHELL-MODEL; ELECTRONIC-STRUCTURE; NIO(001) SURFACE; GROWTH; LEED
- 제목
- Reduction of charge fluctuation energies in ultrathin NiO films on Ag(001)
- 저자
- Yang, Seolun; Park, H. -K.; Kim, J. -S.; Phark, S. -H.; Chang, Young Jun; Noh, T. W.; Hwang, H. -N.; Hwang, C. -C.; Kim, H. -D.
- 발행일
- 2013-10
- 유형
- Article
- 저널명
- Surface Science
- 권
- 616
- 페이지
- 12 ~ 18