Thermal dissociation of CO molecules and carbon incorporation on the Si(111)-(7 x 7) surface
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초록

Incorporation of carbon (C) atoms in the Si(111)-(7 x 7) surface is investigated by using scanning tunneling microscopy and density-functional theory calculations. C atoms are supplied through thermal dissociation of CO molecules adsorbed on the Si(111)-(7 x 7) surface. One C atom can be incorporated substitutionally below the Si adatoms of the (7 x 7) structure. However, the stable (7 x 7) surface can accommodate only a very small amount of C atoms and the surplus C atoms are swept away to the step edges in the form of silicon-carbon clusters, restoring the clean Si(111)-(7 x 7) structure on the flat terrace. In contrast to the B-induced root 3 x root 3 reconstruction, high density C atoms do not induce a single crystalline root 3 x root 3 reconstruction over a wide area of Si(111).

키워드

Scanning tunneling microscopyAb initio calculationCarbonIncorporationSi(111)-(7 x 7) surfaceDECOMPOSITIONADSORPTION
제목
Thermal dissociation of CO molecules and carbon incorporation on the Si(111)-(7 x 7) surface
저자
Seo, EonmiEom, DaejinShin, Eun-HaKim, HanchulKoo, Ja-Yong
DOI
10.1016/j.susc.2020.121589
발행일
2020-06
유형
Article
저널명
Surface Science
696