Annealing effects on the properties of amorphous CoSiB/Pt multilayer films with perpendicular magnetic anisotropy
- Authors
- Jung, Sol; Park, Jisun; Yim, Haein; Kim, Taewan
- Issue Date
- Jan-2014
- Publisher
- KOREAN PHYSICAL SOC
- Keywords
- Perpendicular anisotropy; Annealing effect; Amorphous CoSiB; CoSiB/Pt multilayer
- Citation
- JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.64, no.1, pp 89 - 92
- Pages
- 4
- Journal Title
- JOURNAL OF THE KOREAN PHYSICAL SOCIETY
- Volume
- 64
- Number
- 1
- Start Page
- 89
- End Page
- 92
- URI
- https://scholarworks.sookmyung.ac.kr/handle/2020.sw.sookmyung/11017
- DOI
- 10.3938/jkps.64.89
- ISSN
- 0374-4884
1976-8524
- Abstract
- The perpendicular magnetic anisotropy (PMA) of amorphous CoSiB/Pt multilayer systems was studied as a function of the thickness of the CoSiB/Pt bilayer and the number of repeated CoSiB/Pt bilayers. In this letter, we investigate the thermal property of a CoSiB single layer film annealed at 150 similar to 350 A degrees C for 3 hours and the perpendicular magnetic anisotropic property of amorphous ferromagnetic Ta(50 A degrees A)/Pt(30 A degrees A)/[CoSiB(2, 3, 4, 5, 6 )/Pt(14 )]5/Ta(50 ) multilayer films annealed at 200 similar to 400 A degrees C for 3 hours. The thermal properties were measured by using a differential scanning calorimeter and an X-ray diffractometer, and the magnetic properties were measured by using a vibrating sample magnetometer. The PMA of the CoSiB/Pt multilayer film disappeared and the multilayer film show isotropy after annealing at a temperature of 350 A degrees C or above.
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