Structural and magnetic properties of amorphous and nanocrystalline CoFeSiB thin films
DC Field | Value | Language |
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dc.contributor.author | Yoon, Jungbum | - |
dc.contributor.author | Park, Seung-Young | - |
dc.contributor.author | Jo, Younghun | - |
dc.contributor.author | Jung, Myung-Hwa | - |
dc.contributor.author | You, Chun-Yeol | - |
dc.contributor.author | Kim, Taewan | - |
dc.contributor.author | Hwang, Jae Youn | - |
dc.contributor.author | Yim, Hae In | - |
dc.contributor.author | Rhee, Jang Roh | - |
dc.contributor.author | Chun, Byong Sun | - |
dc.contributor.author | Kim, You Song | - |
dc.contributor.author | Kim, Young Keun | - |
dc.date.available | 2021-02-22T14:33:31Z | - |
dc.date.issued | 2008-07 | - |
dc.identifier.issn | 1536-125X | - |
dc.identifier.issn | 1941-0085 | - |
dc.identifier.uri | https://scholarworks.sookmyung.ac.kr/handle/2020.sw.sookmyung/14229 | - |
dc.description.abstract | This study examined the structural, magnetic, and transport properties of CoFeSiB films with various Co compositions. The main focus was on two samples, amorphous Co(74) Fe(14) Si(14) B(8) and nanocrystalline Co(78) Fe(2) Si(12) B(8) thin films. The results show that the amorphous film is a typical soft magnetic material, while the nanocrystalline film has a large saturation field. It is believed that in a nanocrystalline thin film, a large saturation field is caused by antiferromagnetic exchange at the boundary between the amorphous and nanocrystalline phases. | - |
dc.format.extent | 3 | - |
dc.language | 영어 | - |
dc.language.iso | ENG | - |
dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
dc.title | Structural and magnetic properties of amorphous and nanocrystalline CoFeSiB thin films | - |
dc.type | Article | - |
dc.publisher.location | 미국 | - |
dc.identifier.doi | 10.1109/TNANO.2008.926334 | - |
dc.identifier.scopusid | 2-s2.0-48849115523 | - |
dc.identifier.wosid | 000258766300004 | - |
dc.identifier.bibliographicCitation | IEEE TRANSACTIONS ON NANOTECHNOLOGY, v.7, no.4, pp 409 - 411 | - |
dc.citation.title | IEEE TRANSACTIONS ON NANOTECHNOLOGY | - |
dc.citation.volume | 7 | - |
dc.citation.number | 4 | - |
dc.citation.startPage | 409 | - |
dc.citation.endPage | 411 | - |
dc.type.docType | Article | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalResearchArea | Science & Technology - Other Topics | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.relation.journalWebOfScienceCategory | Nanoscience & Nanotechnology | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.subject.keywordPlus | FREE LAYERS | - |
dc.subject.keywordAuthor | amorphous | - |
dc.subject.keywordAuthor | antiferromagnetic exchange coupling | - |
dc.subject.keywordAuthor | nanocrystalline CoFeSiB thin film | - |
dc.identifier.url | https://ieeexplore.ieee.org/document/4531758 | - |
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