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Low resistivity of Pt silicide nanowires measured using double-scanning-probe tunneling microscopy
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Lim, Do Kyung | - |
| dc.contributor.author | Kubo, Osamu | - |
| dc.contributor.author | Shingaya, Yoshitaka | - |
| dc.contributor.author | Nakayama, Tomonobu | - |
| dc.contributor.author | Kim, Young Heon | - |
| dc.contributor.author | Lee, Jeong Yong | - |
| dc.contributor.author | Aono, Masakazu | - |
| dc.contributor.author | Lee, Hangil | - |
| dc.contributor.author | Lee, Dohyun | - |
| dc.contributor.author | Kim, Sehun | - |
| dc.date.accessioned | 2022-04-19T11:04:09Z | - |
| dc.date.available | 2022-04-19T11:04:09Z | - |
| dc.date.issued | 2008-05 | - |
| dc.identifier.issn | 0003-6951 | - |
| dc.identifier.issn | 1077-3118 | - |
| dc.identifier.uri | https://scholarworks.sookmyung.ac.kr/handle/2020.sw.sookmyung/148209 | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.publisher | AIP | - |
| dc.title | Low resistivity of Pt silicide nanowires measured using double-scanning-probe tunneling microscopy | - |
| dc.type | Article | - |
| dc.publisher.location | 미국 | - |
| dc.identifier.doi | 10.1063/1.2935329 | - |
| dc.identifier.scopusid | 2-s2.0-44349173661 | - |
| dc.identifier.wosid | 000256196600082 | - |
| dc.identifier.bibliographicCitation | Appl. Phys. Lett., v.92, no.20 | - |
| dc.citation.title | Appl. Phys. Lett. | - |
| dc.citation.volume | 92 | - |
| dc.citation.number | 20 | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.identifier.url | https://aip.scitation.org/doi/10.1063/1.2935329 | - |
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