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A Study of Poly(p-phenylenevinylene) and its DerivativesUsing X-ray Photoelectron Spectroscopy
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 이한길 | - |
| dc.contributor.author | 김세훈 | - |
| dc.contributor.author | 황찬용 | - |
| dc.contributor.author | V. Choong | - |
| dc.contributor.author | Y. Park | - |
| dc.contributor.author | Y. Gao | - |
| dc.contributor.author | B. R. Hsieh | - |
| dc.date.accessioned | 2022-04-19T13:24:50Z | - |
| dc.date.available | 2022-04-19T13:24:50Z | - |
| dc.date.issued | 1997-11 | - |
| dc.identifier.issn | 0021-8979 | - |
| dc.identifier.issn | 1089-7550 | - |
| dc.identifier.uri | https://scholarworks.sookmyung.ac.kr/handle/2020.sw.sookmyung/150424 | - |
| dc.description.abstract | Poly(p-phenylenevinylene) and its derivatives (DP-PPV and labeled R-7) were carefully studied using x-ray photoelectron spectroscopy. The C 1s peaks taken from spin-coated thin films of these materials were fitted with the consideration of the bonding state differences (-C=CH and C=C-, etc). The intensity of these C 1s peaks agrees well with the value estimated from the bonding state consideration. © 1997 American Institute of Physics. | - |
| dc.format.extent | 4 | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.publisher | American Institute of Physics | - |
| dc.title | A Study of Poly(p-phenylenevinylene) and its DerivativesUsing X-ray Photoelectron Spectroscopy | - |
| dc.type | Article | - |
| dc.publisher.location | 미국 | - |
| dc.identifier.doi | 10.1063/1.366362 | - |
| dc.identifier.scopusid | 2-s2.0-0031271497 | - |
| dc.identifier.wosid | A1997YG47300041 | - |
| dc.identifier.bibliographicCitation | Journal of Applied Physics, v.82, no.10, pp 4962 - 4965 | - |
| dc.citation.title | Journal of Applied Physics | - |
| dc.citation.volume | 82 | - |
| dc.citation.number | 10 | - |
| dc.citation.startPage | 4962 | - |
| dc.citation.endPage | 4965 | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
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