Nanoscale probing of ferroelectric domain switching using piezoresponse force microscopy
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Yang, Sang Mo | - |
dc.contributor.author | Kim, Yunseok | - |
dc.date.available | 2021-02-22T05:46:23Z | - |
dc.date.issued | 2019-07 | - |
dc.identifier.issn | 1229-7801 | - |
dc.identifier.issn | 2234-0491 | - |
dc.identifier.uri | https://scholarworks.sookmyung.ac.kr/handle/2020.sw.sookmyung/2955 | - |
dc.description.abstract | In ferroelectric materials, piezoresponse force microscopy (PFM) has been widely used to explore ferroelectric domain switching. In this article, we review the fundamentals of nanoscale probing of ferroelectric domain switching using PFM, including the basic principles of PFM and a variety of PFM studies on local domain switching. We also introduce advanced PFM techniques for exploring switching behavior. Finally, we discuss several issues and perspectives in nanoscale probing of ferroelectric domain switching using PFM. PFM has played an important role in exploring switching behavior in ferroelectric materials, and it could be further developed to probe more detailed switching information. © 2019 Korean Ceramic Society. All rights reserved. | - |
dc.format.extent | 10 | - |
dc.language | 영어 | - |
dc.language.iso | ENG | - |
dc.publisher | Korean Ceramic Society | - |
dc.title | Nanoscale probing of ferroelectric domain switching using piezoresponse force microscopy | - |
dc.type | Article | - |
dc.publisher.location | 대한민국 | - |
dc.identifier.doi | 10.4191/kcers.2019.56.4.05 | - |
dc.identifier.scopusid | 2-s2.0-85070802380 | - |
dc.identifier.wosid | 000477903600002 | - |
dc.identifier.bibliographicCitation | Journal of the Korean Ceramic Society, v.56, no.4, pp 340 - 349 | - |
dc.citation.title | Journal of the Korean Ceramic Society | - |
dc.citation.volume | 56 | - |
dc.citation.number | 4 | - |
dc.citation.startPage | 340 | - |
dc.citation.endPage | 349 | - |
dc.type.docType | Article | - |
dc.identifier.kciid | ART002489532 | - |
dc.description.isOpenAccess | Y | - |
dc.description.journalRegisteredClass | scopus | - |
dc.description.journalRegisteredClass | esci | - |
dc.description.journalRegisteredClass | kci | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Ceramics | - |
dc.subject.keywordPlus | Capacitors | - |
dc.subject.keywordPlus | Ferroelectricity | - |
dc.subject.keywordPlus | Nanotechnology | - |
dc.subject.keywordPlus | Scanning probe microscopy | - |
dc.subject.keywordPlus | Switching | - |
dc.subject.keywordPlus | Basic principles | - |
dc.subject.keywordPlus | Domain switchings | - |
dc.subject.keywordPlus | Ferroelectric domain switching | - |
dc.subject.keywordPlus | Ferroelectric domains | - |
dc.subject.keywordPlus | Nano scale | - |
dc.subject.keywordPlus | Piezoresponse force microscopy | - |
dc.subject.keywordPlus | Switching behaviors | - |
dc.subject.keywordPlus | Ferroelectric materials | - |
dc.subject.keywordAuthor | Capacitor | - |
dc.subject.keywordAuthor | Ferroelectric domain | - |
dc.subject.keywordAuthor | Piezoresponse force microscopy | - |
dc.subject.keywordAuthor | Switching behavior | - |
dc.identifier.url | https://www.jkcs.or.kr/journal/view.php?doi=10.4191/kcers.2019.56.4.05 | - |
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