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Parametric Study on the Thermal Response of Electronic Assemblies during Forced Convection-Infrared Reflow Soldering

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dc.contributor.authorShin, Jee Young-
dc.date.accessioned2021-10-26T02:44:12Z-
dc.date.available2021-10-26T02:44:12Z-
dc.identifier.urihttps://scholarworks.sookmyung.ac.kr/handle/2020.sw.sookmyung/55903-
dc.titleParametric Study on the Thermal Response of Electronic Assemblies during Forced Convection-Infrared Reflow Soldering-
dc.typeConference-
dc.citation.titleScientific Society of Measurement, Automation and Thermogrammetry 발표집-
dc.citation.conferenceName14th International Conference on Thermal Engineering and Thermogrammetry-
dc.citation.conferencePlace헝가리-
dc.citation.conferencePlace부다페스트-
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