Shin, Se-Un; Huh, Yeunhee; Ju, Yongmin; Choi, Sungwon; Shin, Changsik; Woo, Young-Jin; Choi, Minseong; Park, Se-Hong; Sohn, Young-Hoon; Ko, Min-Woo, et al.
ArticleIssue Date2018CitationDigest of Technical Papers - IEEE International Solid-State Circuits Conference (ISSCC), v.61, pp 430 - 432PublisherInstitute of Electrical and Electronics Engineers Inc.