Kim, B (Kim, Bongjun); Geier, ML (Geier, Michael L.); Hersam, MC (Hersam, Mark C.); Dodabalapur, A (Dodabalapur, A
ArticleIssue Date2014CitationIEEE ELECTRON DEVICE LETTERS, v.35, no.12, pp 1245 - 1247PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC