Perpendicular Magnetic Anisotropy in CoSiB/Pd/CoSiB Trilayer Thin Films with Varying Pd-Layer Thicknesses
DC Field | Value | Language |
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dc.contributor.author | Jung, Sol | - |
dc.contributor.author | Kim, Taewan | - |
dc.contributor.author | Yim, Haein | - |
dc.date.available | 2021-02-22T11:32:24Z | - |
dc.date.issued | 2015-11 | - |
dc.identifier.issn | 1533-4880 | - |
dc.identifier.issn | 1533-4899 | - |
dc.identifier.uri | https://scholarworks.sookmyung.ac.kr/handle/2020.sw.sookmyung/10181 | - |
dc.description.abstract | We investigate the magnetic properties of CoSiB (15-angstrom-thickness)/Pd (Pd thickness= 8, 11, 14, 17, 20, 24, 27, 29 and 33 angstrom)/CoSiB (15-angstrom-thickness) trilayer thin films. The CoSiB-layer thickness was fixed to 15 angstrom, while the Pd-layer thickness was varied from 8-33 angstrom. In this paper, we present a new type of thin film containing amorphous Co75Si15B10 and Pd. We investigate the magnetic properties of a fabricated CoSiB/Pd/CoSiB trilayer thin film with perpendicular magnetic anisotropy, and determine the correlation between the magnetic properties and the nonmagnetic Pd-layer thickness. With increasing Pd-layer thickness, both the coercivity and the saturation magnetization decreased. Furthermore, the maximum values of the magnetic anisotropy were calculated as 0.3 x 10(6) erg/cc. In order to examine the difference between the in-plane magnetic anisotropy and perpendicular magnetic anisotropy, magnetic force microscopy images of the CoSiB (15-angstrom-thickness)/Pd (Pd thickness = 8 and 14 angstrom)/CoSiB (15-angstrom-thickness) trilayer thin films were obtained. | - |
dc.format.extent | 4 | - |
dc.language | 영어 | - |
dc.language.iso | ENG | - |
dc.publisher | AMER SCIENTIFIC PUBLISHERS | - |
dc.title | Perpendicular Magnetic Anisotropy in CoSiB/Pd/CoSiB Trilayer Thin Films with Varying Pd-Layer Thicknesses | - |
dc.type | Article | - |
dc.publisher.location | 미국 | - |
dc.identifier.doi | 10.1166/jnn.2015.11501 | - |
dc.identifier.scopusid | 2-s2.0-84944714629 | - |
dc.identifier.wosid | 000365554700071 | - |
dc.identifier.bibliographicCitation | JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.15, no.11, pp 8739 - 8742 | - |
dc.citation.title | JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY | - |
dc.citation.volume | 15 | - |
dc.citation.number | 11 | - |
dc.citation.startPage | 8739 | - |
dc.citation.endPage | 8742 | - |
dc.type.docType | Article | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | sci | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Chemistry | - |
dc.relation.journalResearchArea | Science & Technology - Other Topics | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Chemistry, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Nanoscience & Nanotechnology | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.relation.journalWebOfScienceCategory | Physics, Condensed Matter | - |
dc.subject.keywordPlus | AMORPHOUS NIFESIB | - |
dc.subject.keywordPlus | MULTILAYERS | - |
dc.subject.keywordAuthor | Perpendicular Magnetic Anisotropy | - |
dc.subject.keywordAuthor | Amorphous Materials | - |
dc.subject.keywordAuthor | Thin Film | - |
dc.subject.keywordAuthor | CoSiB/Pd/CoSiB | - |
dc.identifier.url | https://www.ingentaconnect.com/content/asp/jnn/2015/00000015/00000011/art00071 | - |
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