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Perpendicular Magnetic Anisotropy in CoSiB/Pd/CoSiB Trilayer Thin Films with Varying Pd-Layer Thicknesses

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dc.contributor.authorJung, Sol-
dc.contributor.authorKim, Taewan-
dc.contributor.authorYim, Haein-
dc.date.available2021-02-22T11:32:24Z-
dc.date.issued2015-11-
dc.identifier.issn1533-4880-
dc.identifier.issn1533-4899-
dc.identifier.urihttps://scholarworks.sookmyung.ac.kr/handle/2020.sw.sookmyung/10181-
dc.description.abstractWe investigate the magnetic properties of CoSiB (15-angstrom-thickness)/Pd (Pd thickness= 8, 11, 14, 17, 20, 24, 27, 29 and 33 angstrom)/CoSiB (15-angstrom-thickness) trilayer thin films. The CoSiB-layer thickness was fixed to 15 angstrom, while the Pd-layer thickness was varied from 8-33 angstrom. In this paper, we present a new type of thin film containing amorphous Co75Si15B10 and Pd. We investigate the magnetic properties of a fabricated CoSiB/Pd/CoSiB trilayer thin film with perpendicular magnetic anisotropy, and determine the correlation between the magnetic properties and the nonmagnetic Pd-layer thickness. With increasing Pd-layer thickness, both the coercivity and the saturation magnetization decreased. Furthermore, the maximum values of the magnetic anisotropy were calculated as 0.3 x 10(6) erg/cc. In order to examine the difference between the in-plane magnetic anisotropy and perpendicular magnetic anisotropy, magnetic force microscopy images of the CoSiB (15-angstrom-thickness)/Pd (Pd thickness = 8 and 14 angstrom)/CoSiB (15-angstrom-thickness) trilayer thin films were obtained.-
dc.format.extent4-
dc.language영어-
dc.language.isoENG-
dc.publisherAMER SCIENTIFIC PUBLISHERS-
dc.titlePerpendicular Magnetic Anisotropy in CoSiB/Pd/CoSiB Trilayer Thin Films with Varying Pd-Layer Thicknesses-
dc.typeArticle-
dc.publisher.location미국-
dc.identifier.doi10.1166/jnn.2015.11501-
dc.identifier.scopusid2-s2.0-84944714629-
dc.identifier.wosid000365554700071-
dc.identifier.bibliographicCitationJOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.15, no.11, pp 8739 - 8742-
dc.citation.titleJOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY-
dc.citation.volume15-
dc.citation.number11-
dc.citation.startPage8739-
dc.citation.endPage8742-
dc.type.docTypeArticle-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClasssci-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaChemistry-
dc.relation.journalResearchAreaScience & Technology - Other Topics-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryChemistry, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryNanoscience & Nanotechnology-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.relation.journalWebOfScienceCategoryPhysics, Condensed Matter-
dc.subject.keywordPlusAMORPHOUS NIFESIB-
dc.subject.keywordPlusMULTILAYERS-
dc.subject.keywordAuthorPerpendicular Magnetic Anisotropy-
dc.subject.keywordAuthorAmorphous Materials-
dc.subject.keywordAuthorThin Film-
dc.subject.keywordAuthorCoSiB/Pd/CoSiB-
dc.identifier.urlhttps://www.ingentaconnect.com/content/asp/jnn/2015/00000015/00000011/art00071-
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