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Perpendicular Magnetic Anisotropy in CoSiB/Pd/CoSiB Trilayer Thin Films with Varying Pd-Layer Thicknesses

Authors
Jung, SolKim, TaewanYim, Haein
Issue Date
Nov-2015
Publisher
AMER SCIENTIFIC PUBLISHERS
Keywords
Perpendicular Magnetic Anisotropy; Amorphous Materials; Thin Film; CoSiB/Pd/CoSiB
Citation
JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.15, no.11, pp 8739 - 8742
Pages
4
Journal Title
JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY
Volume
15
Number
11
Start Page
8739
End Page
8742
URI
https://scholarworks.sookmyung.ac.kr/handle/2020.sw.sookmyung/10181
DOI
10.1166/jnn.2015.11501
ISSN
1533-4880
1533-4899
Abstract
We investigate the magnetic properties of CoSiB (15-angstrom-thickness)/Pd (Pd thickness= 8, 11, 14, 17, 20, 24, 27, 29 and 33 angstrom)/CoSiB (15-angstrom-thickness) trilayer thin films. The CoSiB-layer thickness was fixed to 15 angstrom, while the Pd-layer thickness was varied from 8-33 angstrom. In this paper, we present a new type of thin film containing amorphous Co75Si15B10 and Pd. We investigate the magnetic properties of a fabricated CoSiB/Pd/CoSiB trilayer thin film with perpendicular magnetic anisotropy, and determine the correlation between the magnetic properties and the nonmagnetic Pd-layer thickness. With increasing Pd-layer thickness, both the coercivity and the saturation magnetization decreased. Furthermore, the maximum values of the magnetic anisotropy were calculated as 0.3 x 10(6) erg/cc. In order to examine the difference between the in-plane magnetic anisotropy and perpendicular magnetic anisotropy, magnetic force microscopy images of the CoSiB (15-angstrom-thickness)/Pd (Pd thickness = 8 and 14 angstrom)/CoSiB (15-angstrom-thickness) trilayer thin films were obtained.
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첨단소재·전자융합공학부 (신소재물리전공)
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