Perpendicular Magnetic Anisotropy in CoSiB/Pd/CoSiB Trilayer Thin Films with Varying Pd-Layer Thicknesses
- Authors
- Jung, Sol; Kim, Taewan; Yim, Haein
- Issue Date
- Nov-2015
- Publisher
- AMER SCIENTIFIC PUBLISHERS
- Keywords
- Perpendicular Magnetic Anisotropy; Amorphous Materials; Thin Film; CoSiB/Pd/CoSiB
- Citation
- JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.15, no.11, pp 8739 - 8742
- Pages
- 4
- Journal Title
- JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY
- Volume
- 15
- Number
- 11
- Start Page
- 8739
- End Page
- 8742
- URI
- https://scholarworks.sookmyung.ac.kr/handle/2020.sw.sookmyung/10181
- DOI
- 10.1166/jnn.2015.11501
- ISSN
- 1533-4880
1533-4899
- Abstract
- We investigate the magnetic properties of CoSiB (15-angstrom-thickness)/Pd (Pd thickness= 8, 11, 14, 17, 20, 24, 27, 29 and 33 angstrom)/CoSiB (15-angstrom-thickness) trilayer thin films. The CoSiB-layer thickness was fixed to 15 angstrom, while the Pd-layer thickness was varied from 8-33 angstrom. In this paper, we present a new type of thin film containing amorphous Co75Si15B10 and Pd. We investigate the magnetic properties of a fabricated CoSiB/Pd/CoSiB trilayer thin film with perpendicular magnetic anisotropy, and determine the correlation between the magnetic properties and the nonmagnetic Pd-layer thickness. With increasing Pd-layer thickness, both the coercivity and the saturation magnetization decreased. Furthermore, the maximum values of the magnetic anisotropy were calculated as 0.3 x 10(6) erg/cc. In order to examine the difference between the in-plane magnetic anisotropy and perpendicular magnetic anisotropy, magnetic force microscopy images of the CoSiB (15-angstrom-thickness)/Pd (Pd thickness = 8 and 14 angstrom)/CoSiB (15-angstrom-thickness) trilayer thin films were obtained.
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