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Temporal evolution of the chemical structure during the pattern transfer by ion-beam sputtering

Authors
Ha, N. -B.Jeong, S.Yu, S.Ihm, H. -I.Kim, J. -S.
Issue Date
Jan-2015
Publisher
ELSEVIER
Keywords
Ru; Si; Metallic glass; Ion beam sputtering; Nano patterning
Citation
APPLIED SURFACE SCIENCE, v.324, pp 240 - 244
Pages
5
Journal Title
APPLIED SURFACE SCIENCE
Volume
324
Start Page
240
End Page
244
URI
https://scholarworks.sookmyung.ac.kr/handle/2020.sw.sookmyung/10715
DOI
10.1016/j.apsusc.2014.10.053
ISSN
0169-4332
1873-5584
Abstract
Ru films patterned by ion-beam sputtering (IBS) serve as sacrificial masks for the transfer of the patterns to Si(1 0 0) and metallic glass substrates by continued IBS. Under the same sputter condition, however, both bare substrates remain featureless. Chemical analyses of the individual nano structures simultaneously with the investigation of their morphological evolution reveal that the pattern transfer, despite its apparent success, suffers from premature degradation before the mask is fully removed by IBS. Moreover, the residue of the mask or Ru atoms stubbornly remains near the surface, resulting in unintended doping or alloying of both patterned substrates. (C) 2014 Elsevier B.V. All rights reserved.
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