Thickness-dependent orientation evolution in nickel thin films grown on yttria-stabilized zirconia single crystals
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Viswanath, B (Viswanath, B.) | - |
dc.contributor.author | Ko, C (Ko, Changhyun) | - |
dc.contributor.author | Ramanathan, S (Ramanathan, Shr | - |
dc.date.accessioned | 2022-04-19T10:42:26Z | - |
dc.date.available | 2022-04-19T10:42:26Z | - |
dc.date.issued | 2011-12 | - |
dc.identifier.issn | 1478-6435 | - |
dc.identifier.issn | 1478-6443 | - |
dc.identifier.uri | https://scholarworks.sookmyung.ac.kr/handle/2020.sw.sookmyung/147833 | - |
dc.description.abstract | Microstructure evolution along with crystallographic orientation change as a function of film thickness was investigated in Ni thin films grown on (100) yttria-stabilized zirconia (YSZ) single crystal substrates. Texture development with two different orientation relationships, OR1: Ni {111}//YSZ {100} and OR2: Ni {100}//YSZ {100}, cube on cube orientation were identified by X-ray diffraction and transmission electron microscopy depending on the film thickness. The observed orientation transition reveals the existence of a critical thickness (similar to 320 nm) favoring two different orientations in sputtered Ni films on YSZ (100) substrate. | - |
dc.format.extent | 13 | - |
dc.language | 영어 | - |
dc.language.iso | ENG | - |
dc.publisher | TAYLOR FRANCIS LTD | - |
dc.title | Thickness-dependent orientation evolution in nickel thin films grown on yttria-stabilized zirconia single crystals | - |
dc.type | Article | - |
dc.publisher.location | 영국 | - |
dc.identifier.doi | 10.1080/14786435.2011.608086 | - |
dc.identifier.scopusid | 2-s2.0-84855660643 | - |
dc.identifier.wosid | 000298585300002 | - |
dc.identifier.bibliographicCitation | PHILOSOPHICAL MAGAZINE, v.91, no.34, pp 4311 - 4323 | - |
dc.citation.title | PHILOSOPHICAL MAGAZINE | - |
dc.citation.volume | 91 | - |
dc.citation.number | 34 | - |
dc.citation.startPage | 4311 | - |
dc.citation.endPage | 4323 | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | sci | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.identifier.url | https://www.tandfonline.com/doi/abs/10.1080/14786435.2011.608086 | - |
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