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In situ studies on twinning and cracking proximal to insulator-metal transition in self-supported VO2/Si3N4 membranes

Authors
Balakrishnan, V (Balakrishnan,Ko, C (Ko, Changhyun)Ramanathan, S (Ramanathan, Shr
Issue Date
Jun-2012
Publisher
CAMBRIDGE UNIV PRESS
Keywords
fracture; metal-insulator transition; transmission electron microscopy (TEM)
Citation
JOURNAL OF MATERIALS RESEARCH, v.27, no.11, pp 1476 - 1481
Pages
6
Journal Title
JOURNAL OF MATERIALS RESEARCH
Volume
27
Number
11
Start Page
1476
End Page
1481
URI
https://scholarworks.sookmyung.ac.kr/handle/2020.sw.sookmyung/147612
DOI
10.1557/jmr.2012.93
ISSN
0884-2914
2044-5326
Abstract
Mechanisms leading to correlation between structural phase transitions in functional oxides and consequent insulator-metal transitions driven by band gap closure are an active area of research. In cases where large volume changes are present, structural stability considerations become important. Here, we present in situ studies of mechanical instability of VO2 grown on self-supported Si3N4 membranes spanning the structural phase transition boundary of vanadium dioxide. We observe film cracking across the phase transition, and the transition-induced cracks correlate with the symmetry change and the corresponding changes in the optical/electrical response arising from the insulator-metal transition. Transmission electron microscopy studies revealed twinned platelets proximal to crack regions. Interestingly, the membranes are mechanically stable until a large fraction of resistance change occurs across the phase transition. The ability to manipulate the stability and controlled rupture of self-supported membranes through temperature or other stimuli could be of interest to microelectromechanical systems and sensor devices.
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Ko, Chang Hyun
첨단소재·전자융합공학부 (신소재물리전공)
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