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Low resistivity of Pt silicide nanowires measured using double-scanning-probe tunneling microscopy
- Authors
- Lim, Do Kyung; Kubo, Osamu; Shingaya, Yoshitaka; Nakayama, Tomonobu; Kim, Young Heon; Lee, Jeong Yong; Aono, Masakazu; Lee, Hangil; Lee, Dohyun; Kim, Sehun
- Issue Date
- May-2008
- Publisher
- AIP
- Citation
- Appl. Phys. Lett., v.92, no.20
- Journal Title
- Appl. Phys. Lett.
- Volume
- 92
- Number
- 20
- ISSN
- 0003-6951
1077-3118
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