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Results 1-1 of 1 (Search time: 0.003 seconds).
Dispersive capacitance and conductance across the phase transition boundary in metal-vanadium oxide-silicon devices
Ko, Changhyun
; Ramanathan, Shriram
Article
Issue Date
2009
Citation
JOURNAL OF APPLIED PHYSICS, v.106, no.3, pp 1 - 6
Publisher
AMER INST PHYSICS
1
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Ko, Chang Hyun
1
Ramanathan, Shriram
1
Subject
electric admittance
1
elemental semiconductors
1
metal-insulator transition
1
silicon
1
vanadium compounds
1
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2009
1
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Article
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ENG
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