Thickness-dependent orientation evolution in nickel thin films grown on yttria-stabilized zirconia single crystals

Abstract

Microstructure evolution along with crystallographic orientation change as a function of film thickness was investigated in Ni thin films grown on (100) yttria-stabilized zirconia (YSZ) single crystal substrates. Texture development with two different orientation relationships, OR1: Ni {111}//YSZ {100} and OR2: Ni {100}//YSZ {100}, cube on cube orientation were identified by X-ray diffraction and transmission electron microscopy depending on the film thickness. The observed orientation transition reveals the existence of a critical thickness (similar to 320 nm) favoring two different orientations in sputtered Ni films on YSZ (100) substrate.